Lanthanum Aluminate
LaAlO3

Our company performs integrated production from crystal growth by CZ method to substrate processing.
Please make use of our substrate for your various epitaxial growth research.

 

Characteristics

Composition LaAlO3
Crystal system Trigonal (Pseudo-cubic)
Crystal structure Pseudo-perovskite
Lattice constant a=0.379 nm (Pseudo-cubic)
Melting point 2100 ℃
Crystal growth method CZ method
Density 6.52 g/cm3 (20 ℃)
Dielectric constant 15~22 (300 K, 1MHz)
Thermal expansion coefficient 12.6×10-6/℃
Phase transition Approx. 420℃
(Trigonal ⇔ Cubic)
Twin crystal Generated by phase transition

※The precise system is trigonal (a=0.5357 nm, α=60.1°), but it is generally treated as pseudo-cubic or hexagonal.

 

 

Transmittance of LaAlO3

 

 

Standard specs

Size
(Outer size tolerance: ±0.1 mm / Thickness tolerance: ±0.05 mm)
10×10×0.5 t
15×15×0.5 t
Orientation
(Tolerance: ±0.5°)
(100), (110)
Pseudo-cubic
Polishing One-side / Both-side
Surface roughness Ra≦1.0 nm, Rmax≦5.0 nm
Options STEP substrate
OFF substrate
Breakable substrate

※If you are looking for other specs, please contact us.